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1

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels –An explanation and die protection strategy

M.S.B. Sowariraj, Theo Smedes, Cora Salm, Ton Mouthaan, Fred G Kuper

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 1.26 MB

2003

2

Rise-time effects in grounded gate nMOS transistors under transmission line pulse stress

Gianluca Boselli, Ton Mouthaan, Fred Kuper

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 225 KB

english, 2000

3

Investigations on double-diffused MOS transistors under ESD zap conditions

Gianluca Boselli, Stan Meeuwsen, Ton Mouthaan, Fred Kuper

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 778 KB

english, 2001

4

A 3-D Circuit Model to evaluate CDM performance of ICs

M.S.B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton Mouthaan, Fred G Kuper

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 695 KB

english, 2005

5

The modeling of resistance changes in the early phase of electromigration

Ton J Mouthaan, Violeta Petrescu

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 405 KB

english, 1998

6

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress

M.S.B. Sowariraj, Cora Salm, Ton Mouthaan, Fred G Kuper, Theo Smedes

Journal:

Microelectronics Reliability

Year:

2002

File:

PDF, 1.11 MB

2002

7

Guest Editorial

Ton J Mouthaan, Hiroshi Onoda

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 48 KB

english, 1999

8

A vertically integrated dynamic RAM-cell: Buried bit line memory cell with floating transfer layer

Ton Mouthaan, Maarten Vertregt

Journal:

Solid-State Electronics

Year:

1986

Language:

english

File:

PDF, 516 KB

english, 1986

9

Physics of electro-thermal effects in ESD protection devices

Benno Krabbenborg, Reinier Beltman, Philip Wolbert, Ton Mouthaan

Journal:

Journal of Electrostatics

Year:

1992

Language:

english

File:

PDF, 1.29 MB

english, 1992

10

[IEEE Second IEEE International Workshop on Electronic Design, Test and Applications - Perth, Australia (28-30 Jan. 2004)] Second IEEE International Workshop on Electronic Design, Test and Applications - A Case Study of a Microsystems MSc Curriculum

Year:

2004

Language:

english

File:

PDF, 82 KB

english, 2004

11

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress

Sowariraj, M.S.B., de Jong, P.C., Salm, C., Smedes, T., Ton Mouthaan, A.J., Kuper, F.G.

Year:

2005

Language:

english

File:

PDF, 417 KB

english, 2005

12

Microelectronics Education ||

Mouthaan, Ton J., Salm, Cora

Year:

1998

Language:

english

File:

PDF, 38.21 MB

english, 1998

13

Microelectronics Education || Optimisation of a Solar Cell

Mouthaan, Ton J., Salm, Cora

Year:

1998

Language:

english

File:

PDF, 778 KB

english, 1998

14

[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - CreaTe: A New Programme to Attract Engineers as Design Artists

Ruttkay, Zsofi, Mouthaan, Ton

Year:

2008

Language:

english

File:

PDF, 497 KB

english, 2008